A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects

Excerpt

arXiv:2610.06464v1 Announce Type: cross Abstract: As technology scales to smaller nodes, increasing current densities make electromigration (EM) one of the dominant reliability challenges in on-chip interconnects. Accurate transient stress analysis is needed to identify wires susceptible to EM degradation, but applying physics-based solvers across many interconnects remains computationally expensive. This paper proposes a physics-guided transformer framework for fast EM stress prediction in mult